Microprocessor testing and self-test techniques constitute a critical domain in ensuring the reliability and performance of modern computing devices. These methodologies encompass both hardware and ...

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In materials science, thermal testing refers to the process of subjecting materials to analysis through thermal control in order to collect data on a wide range of properties. Generally, thermal ...

Despite its standardization as IEEE 1149.1 in 1990 and wide use in the industry, many test engineers and developers still do not fully understand the benefits of boundary scan test. The misconceptions ...

In-circuit testers rely on bed-of-nails-type fixtures that give the tester access to every node (or net) of the printed circuit board (PCB). Using this access, the tester takes a divide-and-conquer ...