EDN

Spring contact probe

The Eccentric plunger probe employs a patented biasing design that improves the reliability and longevity of the probe by reducing resistance and probe wear. By drilling the plunger’s spring cavity in ...
Electronic Design

Test Clips Employ Spring Probe Design

Exploiting a proven spring-probe design, the QUAD-4 test clip ensures secure, non-evasive contact for Micron TSOPII packaged ICs. It is designed to clip over surface-mounted DDR SDRAM memories in the ...
EDN

Spring-probe test clips target TSOPII packages

If you've ever tenuously probed an expensive IC in a surface-mount package, you'll appreciate these new test adjuncts from Emulation Technology (ET—Santa Clara, Calif.). It's rolling out test clips ...
Electronic Design

ECT reports ZIP spring probe wins head-to-head competition

Fontana, CA. Everett Charles Technologies (ECT) announced it has won a head-to-head evaluation using ZIP Z0-040 probes made with HyperCore material in a high-volume production environment at a large ...