EDN

Analysis of Failure Models on Short-Circuit Events for SiC Devices

SiC MOSFETs are usually susceptible to damage as a result of short-circuiting events because of the fast switching speeds and low on-state resistance. 3 A team of researchers affiliated with the ...
Semiconductor Engineering

Short-Circuit Ruggedness In SiC MOSFETs

Trench-based silicon carbide power MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors) represent a dramatic improvement in the Figure of Merit (FOM) values of power conversion switching ...
Semiconductor Engineering

Anode Interlayers To Reduce Interfacial Resistance Of Solid-State Li-Metal Batteries And Prevent Short-Circuit Formation

A technical paper titled “Design Strategies for Anodes and Interfaces Toward Practical Solid-State Li-Metal Batteries” was published by researchers at Samsung Advanced Institute of Technology.
Compound Semiconductor

When every microsecond counts

In these scenarios every microsecond counts, and standard protective devices, such as fuses, relays, and moulded case circuit ...
Science Daily

Scientists pinpoint cause of harmful dendrites and whiskers in lithium batteries

Scientists have uncovered a root cause of the growth of needle-like structures -- known as dendrites and whiskers -- that plague lithium batteries, sometimes causing a short circuit, failure, or even ...
Post-Bulletin

Circuit breaker failure led to fatal mine explosion

DULUTH, Minn. — The fatal explosion at the United Taconite plant in Forbes last fall resulted from management’s failure to make sure that all electrical circuits had properly maintained overload ...