(Nanowerk Spotlight) Scientists have sought to leverage atomic defects to enhance electrocatalytic performance for clean energy applications. However, the inability to precisely study defects' ...

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

Emergence of anti-hyperuniform defect organization in active nematics. At high activity (left), topological defects are distributed nearly uniformly throughout the system. Reducing activity toward a ...

SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...