CLEVELAND--(BUSINESS WIRE)--Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model ...

A very common and well-known practice by manufacturers during the IC test process is to test as many of the device die or packaged parts as possible in parallel (i.e. sites) during wafer sort and ...

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

Keithley Instruments has announced the publication of Parallel Test Technology: The New Paradigm for Parametric Testing, a handbook that covers semiconductor parametric testing. The free, 60-page book ...

Culver City, Calif.-based Parallel Systems is testing autonomous battery-electric railcars for short-haul freight operations, and has raised $49.55 million in Series A funds to help build a fleet, ...

Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...