The use of hierarchical DFT methods is growing as design size and complexity stresses memory requirements and design schedules. Hierarchical DFT divides the design into smaller pieces, creates test ...

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...

Design-for-test (DFT) is essential to ensure that complex designs can be thoroughly tested. Testing demands continue to increase as designs grow in gate count and fabrication process technologies ...

The integration of DFT Compiler in the physical compiler environment facilitates design-for-test (DFT) closure. According to the manufacturer, this addition enables fast timing closure with fully ...

It is often said that the emergence of the System-on-Chip will require fundamental changes in the approaches to design for testability (DFT.) These changes, it has been suggested, will take the form ...

Zuken® and XJTAG® have released a plugin that will enhance Zuken’s CR-8000 with a design for test (DFT) capability improving test coverage by allowing additional design checks during schematic entry.

New product line debuts; collaboration with ASIC Architect enables combination of silicon-proven PCIe PHY with link controller and IP verification by Avery Design SAN FRANCISCO -- Nov. 14, 2007-- ...

Die size and power estimations are at the foundation of SoC implementation. The key is how early and how accurately can it be done. These two parameters are the main data point for making some ...